Browse by Subject "UO2"
Now showing items 1-4 of 4
(2012-02-06)Radiation-enhanced diffusion (RED) of a Nd buried tracer layer in UO2 thin films was measured with Secondary Ion Mass Spectrometry (SIMS). Samples were irradiated with 1.8 MeV Kr+ over a temperature range from 400 to 800 ...
(2013-08-22)Anion radiation enhanced diffusion (RED) and thermal diffusion of a buried 18O tracer layer in thin film UO2 was measured using Secondary-Ion Mass Spectroscopy (SIMS). Thin films were grown using a dedicated magnetron ...
(2012-02-01)This thesis presents experimental results on thermal conductivity measurements on both irradiated and unirradiated uranium oxides between 90 K and 658 K. The irradiation doses range from 5x10^13 argon ions/cm² to 2x10^16 ...
X-ray photoelectron spectroscopy (XPS) study of single crystal UO2 and U3O8 on r-plane sapphire and yttrium stabilized zirconium (YSZ) substrates (2011-05-25)The purpose of the work performed in this thesis is to demonstrate the ability of a magnetron sputtering system to grow single crystal thin films of Uranium Oxides with and without specifically added Neodymium impurities. ...