Browse by Subject "electrostatic discharge"
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(2012-05-22)This work focuses on methods for testing and increasing the robustness of integrated circuits (ICs) to electrostatic discharge (ESD). Specifically, this work focuses on charged device model (CDM) protection and test ...
(2008-05)Metal oxide semiconductor field effect transistor (MOSFET) scaling and more complex design techniques have pushed the capabilities of the microelectronics and the integrated circuit industry. However, these advancements ...