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Title:Investigating soft failures induced by system-level ESD
Author(s):Vora, Sandeep Gautam
Advisor(s):Rosenbaum, Elyse
Department / Program:Electrical & Computer Eng
Discipline:Electrical & Computer Engr
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:M.S.
Genre:Thesis
Subject(s):ESD
Soft Failures
System-Level ESD
IEC 61000-4-2
Soft Failure
Abstract:Hardware and application-level manifestations of ESD soft failures were characterized for three single-board computers. ESD events were generated following the system-level ESD standard (IEC 61000-4-2), matching real-world testing and events. Soft failures resulting from ESD were seen on all products tested. Failures associated with the peripheral ICs occur independently of the application being run; the application-dependent failures are attributed to noise at the CPU.
Issue Date:2018-12-11
Type:Thesis
URI:http://hdl.handle.net/2142/102509
Rights Information:Copyright 2018 Sandeep Vora
Date Available in IDEALS:2019-02-06
Date Deposited:2018-12


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