Enhancing Defect Coverage of VLSI Chips by Using Cost Effective Delay Fault Tests

Sharma, Manish
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Title:Enhancing Defect Coverage of VLSI Chips by Using Cost Effective Delay Fault Tests
Author(s):Sharma, Manish
Subject(s):VLSI testing
Delay fault testing
Path delay test generation
Design for test
Issue Date:2003-10
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-03-2220, CRHC-03-11
Type:Text
Language:English
URI:http://hdl.handle.net/2142/103854
Sponsor:Semiconductor Research Corp. / SRC 99-TJ-717
DARPA
Hewlett Packard
Date Available in IDEALS:2019-05-17


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