Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  97-2236.pdf (5MB) | Full text |
Description
| Title: | Efficient Testing for Bridging Faults in Digital Integrated Circuits |
| Author(s): | Chen, Tzu-Hao |
| Subject(s): | Bridging fault
Fault extraction Fault simulation Test generation Diagnosis |
| Issue Date: | 1997-12 |
| Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-97-2236, DAC-62 |
| Type: | Text |
| Language: | English |
| URI: | http://hdl.handle.net/2142/103917 |
| Sponsor: | SRC |
| Date Available in IDEALS: | 2019-05-21 |