Files in this item
Files | Description | Format |
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application/pdf ![]() ![]() | Full text |
Description
Title: | Efficient Testing for Bridging Faults in Digital Integrated Circuits |
Author(s): | Chen, Tzu-Hao |
Subject(s): | Bridging fault
Fault extraction Fault simulation Test generation Diagnosis |
Issue Date: | 1997-12 |
Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-97-2236, DAC-62 |
Type: | Text |
Language: | English |
URI: | http://hdl.handle.net/2142/103917 |
Sponsor: | SRC |
Date Available in IDEALS: | 2019-05-21 |