Files in this item

FilesDescriptionFormat

application/pdf

application/pdf98-2219.pdf (6MB)Restricted to U of Illinois
Full textPDF

Description

Title:Design Automation for Reliable CMOS Chip I/O Circuits
Author(s):Li, Tong
Subject(s):Design automation
CMOS circuits
VLSI
Electrostatic discharge (ESD)
Reliability
Issue Date:1998-08
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-98-2219, DAC-66
Type:Text
Language:English
URI:http://hdl.handle.net/2142/103927
Sponsor:Joint Services Electronics Program / N00014-90-J-1270, 98-DJ-613, F30602-94-1-0006
Date Available in IDEALS:2019-05-21


This item appears in the following Collection(s)

Item Statistics