Browse Dept. of Computer Science by Author "Ramachandran, Pradeep"

  • Ramachandran, Pradeep (2011-05-25)
    Aggressive scaling of CMOS transistors has enabled extensive system integration and building faster and more efficient systems. On the flip side, this has resulted in an increasing number of devices that fail in shipped ...

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  • Ramachandran, Pradeep; Adve, Sarita V.; Bose, Pradip; Rivers, Jude A.; Srinivasan, Jayanth (2006-08)
    This work concerns appropriate metrics for evaluating microarchitectural enhancements to improve processor lifetime reliability. The most commonly used reliability metric is mean time to failure (MTTF). However, MTTF does ...

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  • Li, Man-Lap; Ramachandran, Pradeep; Adve, Sarita V.; Adve, Vikram S.; Zhou, YuanYuan (2007-02)
    With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field faults. To be broadly deployable, the hardware reliability solution must incur low overheads, precluding use of expensive ...

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