Browse Research and Tech Reports - Computer Science by Author "Ramachandran, Pradeep"

  • Ramachandran, Pradeep; Adve, Sarita V.; Bose, Pradip; Rivers, Jude A.; Srinivasan, Jayanth (2006-08)
    This work concerns appropriate metrics for evaluating microarchitectural enhancements to improve processor lifetime reliability. The most commonly used reliability metric is mean time to failure (MTTF). However, MTTF does ...

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  • Li, Man-Lap; Ramachandran, Pradeep; Adve, Sarita V.; Adve, Vikram S.; Zhou, YuanYuan (2007-02)
    With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field faults. To be broadly deployable, the hardware reliability solution must incur low overheads, precluding use of expensive ...

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