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Description
Title: | Condition monitoring of SiC MOSFETs on LLC resonant converter |
Author(s): | Wang, Patrick John |
Advisor(s): | Banerjee, Arijit |
Department / Program: | Electrical & Computer Eng |
Discipline: | Electrical & Computer Engr |
Degree Granting Institution: | University of Illinois at Urbana-Champaign |
Degree: | M.S. |
Genre: | Thesis |
Subject(s): | Silicon Carbide
MOSFET Reliability Condition Monitoring DC-DC converter Power Electronics Gate Driver Circuits LLC resonant converter |
Abstract: | Silicon carbide (SiC) MOSFETs are widely acknowledged for low loss, fast switching and remarkable thermal conductivity compared to silicon (Si) counterparts. SiC-based power electronic converters, therefore, are optimal when operated at medium voltage to high voltage in high switching frequency applications, which results in a much higher power density than Si-based power converters. The reliability of SiC devices, however, remains a significant hindrance to their wide adoption in power electronics in transportation, industry and military applications. Real-time condition monitoring of SiC devices in SiC-based power converters addresses the reliability issues by providing an early sign of potential failure. Since one of the most consistent failure precursors of a degraded SiC MOSFET is an increase of gate leakage current, a circuitry is developed to track and estimate the on-state gate leakage current of the device during operation. To demonstrate the functionality of the proposed method, an LLC full-bridge resonant converter that operates at a medium voltage and high switching frequency was designed and used to obtain the experimental results. This converter will operate at various duty ratios, DC-link voltages, switching frequencies and output loads to show the consistency and accuracy of the proposed condition monitoring method. With proper calibration, this cost-effective method obtains an accurate gate leakage estimation which opens opportunities to perform prognostic and health monitoring of SiC devices. |
Issue Date: | 2021-04-26 |
Type: | Thesis |
URI: | http://hdl.handle.net/2142/110734 |
Rights Information: | Copyright 2021 Patrick Wang |
Date Available in IDEALS: | 2021-09-17 |
Date Deposited: | 2021-05 |
This item appears in the following Collection(s)
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Dissertations and Theses - Electrical and Computer Engineering
Dissertations and Theses in Electrical and Computer Engineering -
Graduate Dissertations and Theses at Illinois
Graduate Theses and Dissertations at Illinois