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Title:In situ power-loss estimation of IGBT modules
Author(s):Jin, Qichen
Advisor(s):Banerjee, Arijit
Department / Program:Electrical & Computer Eng
Discipline:Electrical & Computer Engr
Degree Granting Institution:University of Illinois at Urbana-Champaign
real-time monitoring
lifetime estimation
Abstract:A fault detection and prediction method for insulated-gate bipolar transistors (IGBTs) has been improved over the past decades to reduce system downtime. In situ lifetime estimation of IGBT modules has been challenging due to a number of requirements: the necessity to operate at high voltage in the switching environment and the measurement precision of the gate-threshold voltage or collector-to-emitter voltage. This thesis presents a wear-fatigue estimation framework that consists of collector-to-emitter measurement, power loss calculation, and thermal lifetime prediction model. The measurement circuit enables the estimation of power loss across a variety of IGBT modules with minimum impact on system reliability.
Issue Date:2021-04-29
Rights Information:Copyright 2021 Qichen Jin
Date Available in IDEALS:2021-09-17
Date Deposited:2021-05

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