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ACRC Technical Report 85PDF


Title:Optical Measurement of Liquid Film Thickness and Wave Velocity in Liquid Film Flows
Author(s):Hurlburt, E.T.; Newell, T.A.
Subject(s):two-phase modeling
annular flow regimes
stratified flow regimes
Abstract:Two optical techniques are described for measurement of a liquid film's surface. Both techniques make use of the total internal reflection which occurs at a liquid-vapor interface due to the refractive index difference between a liquid and a vapor. The fIrst technique is used for film thickness determination. A video camera records the distance between a light source and the rays which are reflected back from the liquid-vapor interface. This distance can be shown to be linearly proportional to film thickness. The second technique measures surface wave velocities. Two photosensors, spaced a fIxed distance apart, are used to record the time varying intensity of light reflected from the liquid-vapor interface. The velocity is then deduced from the time lag between the two signals.
Issue Date:1995-09
Publisher:Air Conditioning and Refrigeration Center. College of Engineering. University of Illinois at Urbana-Champaign.
Series/Report:Air Conditioning and Refrigeration Center TR-85
Genre:Technical Report
Sponsor:Air Conditioning and Refrigeration Center Project 45
Date Available in IDEALS:2009-04-20

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