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Optical Measurement of Liquid Film Thickness and Wave Velocity in Liquid Film Flows

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PDF TR085.pdf (1MB) ACRC Technical Report 85 PDF
Title: Optical Measurement of Liquid Film Thickness and Wave Velocity in Liquid Film Flows
Author(s): Hurlburt, E.T.; Newell, T.A.
Subject(s): two-phase modeling annular flow regimes stratified flow regimes
Abstract: Two optical techniques are described for measurement of a liquid film's surface. Both techniques make use of the total internal reflection which occurs at a liquid-vapor interface due to the refractive index difference between a liquid and a vapor. The fIrst technique is used for film thickness determination. A video camera records the distance between a light source and the rays which are reflected back from the liquid-vapor interface. This distance can be shown to be linearly proportional to film thickness. The second technique measures surface wave velocities. Two photosensors, spaced a fIxed distance apart, are used to record the time varying intensity of light reflected from the liquid-vapor interface. The velocity is then deduced from the time lag between the two signals.
Issue Date: 1995-09
Publisher: Air Conditioning and Refrigeration Center. College of Engineering. University of Illinois at Urbana-Champaign.
Series/Report: Air Conditioning and Refrigeration Center TR-85
Genre: Technical Report
Type: Text
Language: English
URI: http://hdl.handle.net/2142/11117
Sponsor: Air Conditioning and Refrigeration Center Project 45
Date Available in IDEALS: 2009-04-20
 

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