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Title:Atomic force microscope cantilever with reduced second harmonic frequency during tip-surface contact
Author(s):Felts, Jonathan
Advisor(s):King, William P.
Contributor(s):King, William P.
Department / Program:Mechanical Sci & Engineering
Discipline:Mechanical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):Atomic Force Microscope
micro cantilever
harmonic frequency
mode shapes
Abstract:We describe an atomic force microscope cantilever design for which the second flexural mode frequency can be tailored relative to the first mode frequency, for operation in contact with a substrate. A freely-resonating paddle internal to the cantilever reduces the stiffness of the second flexural mode relative to the first while nearly maintaining the mass of the original cantilever. This strategy allows the ratio of the first two resonant modes f2/f1 to be controlled over the range 1.6 – 4.5. The ability to vary f2/f1 could improve a variety of dynamic contact-mode measurements.
Issue Date:2010-01-06
Rights Information:Copyright 2009 Jonathan R. Felts
Date Available in IDEALS:2010-01-06
Date Deposited:December 2

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