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Title:A digital integrated circuit tester
Author(s):Hanson, Donald F.
Subject(s):Digital integrated circuits -- Testing
Issue Date:1975
Publisher:Champaign, IL: Department of Electrical Engineering. University of Illinois at Urbana-Champaign.
Type:Text
Language:English
Description:Bibliography : p. 21.
URI:http://hdl.handle.net/10111/UIUCOCA:Archive/digitalintegrate00hans
http://hdl.handle.net/2142/17137
Rights Information:Copyright 1975 Board of Trustees University of Illinois.
Date Available in IDEALS:2010-09-21
Has Version(s):http://hdl.handle.net/10111/UIUCOCA:digitalintegrate00hans
http://www.archive.org/details/digitalintegrate00hans
Identifier in Online Catalog:323725
OCLC Identifier:(OCoLC)ocm05120766


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