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Title:Characterization and Engineering of Error Statistics for Reliable Computation
Author(s):Lee, Yu-Hung
Advisor(s):Shanbhag, Naresh R.
Department / Program:Electrical & Computer Eng
Discipline:Electrical & Computer Engr
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):robust system design
error statistics
diversity technique
error model
Abstract:We make a case for developing statistical error models of nanoscale circuits, employing these for designing robust systems, and engineering error-statistics to enhance the performance of various robust design techniques. A simple additive error model is presented for arithmetic computations. The proposed error model is shown to be a strong function of the architecture, and a weak function of the input statistics, thus enabling a one-time off-line characterization similar to delay and power characterization done presently. In addition, we propose architectural diversity and scheduling diversity to engineer the occurrence of independent errors as required by robust system design techniques such as soft N-modular redundancy (NMR). Finally, we employ error statistics to develop soft dual-MR (DMR) and triple-MR (TMR) techniques for the adder operation and the filter design. All quantitative results are demonstrated in a commercial 45 nm CMOS process.
Issue Date:2011-01-14
Rights Information:Copyright 2010 Yu-Hung Lee
Date Available in IDEALS:2011-01-14
Date Deposited:December 2

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