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Title:Characterization and comparison of optical source relative intensity noise and effects in optical coherence tomography
Author(s):Shin, Sunghwan
Advisor(s):Boppart, Stephen A.
Department / Program:Electrical & Computer Eng
Discipline:Electrical & Computer Engr
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):optical coherence tomography
relative intensity noise
Abstract:This thesis research investigates the effects of optical source noise in optical coherence tomography (OCT). While shot noise, thermal noise and relative intensity noise (RIN) (excess photon noise) constitute optical noise, RIN is the least understood and often the most significant factor limiting the sensitivity of an optical system. The existing and prevalent theory being used for estimating RIN for various light sources in OCT is questionable, and cannot be applied uniformly for different types of sources. The origin of noise in various sources varies significantly, owing to the different physical nature of photon generation. In this thesis, RIN of several OCT light sources are characterized and compared. Light sources include a super-luminescent diode (SLD), an erbium-doped fiber amplifier (EDFA), multiplexed SLDs, and a continuous wave (cw) laser. A method for the reduction of RIN by amplifying the SLD light output by using a gain-saturated semiconductor optical amplifier (SOA) is reported. Also, measurements using a time-domain OCT (TD-OCT) system are performed to verify the effects of optical source noise reduction on OCT data. Simulations comparing OCT and ISAM images assuming an identical optical source noise are also performed and explained.
Issue Date:2011-01-21
Rights Information:Copyright 2010 Sunghwan Shin
Date Available in IDEALS:2011-01-21
Date Deposited:2010-12

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