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Superconducting Transition-Edge Sensor Physics

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Title: Superconducting Transition-Edge Sensor Physics
Author(s): Sadleir, John E.
Director of Research: Robinson, Ian K.
Doctoral Committee Chair(s): Chiang, Tai-Chang
Doctoral Committee Member(s): Robinson, Ian K.; Errede, Steven M.; Selvin, Paul R.
Department / Program: Physics
Discipline: Physics
Degree Granting Institution: University of Illinois at Urbana-Champaign
Degree: Ph.D.
Genre: Dissertation
Subject(s): Superconductivity Superconductors proximity effect inverse proximity effect superconducting weak-link SNS NSN SNS weak links SN'S weak links SS'S SN heterostructures superconducting normal-metal heterostructures critical current effects rectification critical current asymmetry Ic asymmetry edge-barrier critical current geometric barrier critical current stress effects in superconducting thin films Transition Edge Sensors(TES) superconducting transition edge sensors superconducting transition edge sensors(TES) Superconducting phase thermometers Percolation theory random superconducting resistor network nonequilibrium superconductivity longitudinal proximity effect lateral inverse proximity effect x-ray detectors microcalorimeters quantum calorimeters quantum microcalorimeters bolometers microwave bolometers infra-red bolometers Josephson Effect Fraunhofer pattern Fraunhofer interference pattern Fraunhofer diffraction pattern superconducting molybdenum thin films paraconductivity Josephson weak-link superconducting normal metal bilayers SN trilayers superconducting transition superconducting phase transition superconducting phase transition width transition width superconducting resistive transition resistive transition width excess current effects R(I,T) surface R(I,T,B) surface magnetic flux quantization exponential critical current superconducting critical length spatially varying superconducting order parameter spatial variation of the superconducting order parameter superconducting transition temperature critical current evolution Josephson critical current nonuniform superconductivity Longitudinal proximity effect longitudinal proximity e ect (LoPE) Lateral Inverse Proximity Effect lateral inverse proximity e ffect (LaiPE) Self-fielding effects flux focusing
Abstract: Despite record-setting performance demonstrated by superconducting Transition Edge Sensors (TESs) and growing utilization of the technology, a theoretical model of the physics governing TES devices superconducting phase transition has proven elusive. Earlier attempts to describe TESs assumed them to be uniform superconductors. Sadleir et al. 2010 shows that TESs are weak links and that the superconducting order parameter strength has significant spatial variation. Measurements are presented of the temperature T and magnetic field B dependence of the critical current Ic measured over 7 orders of magnitude on square Mo/Au bilayers ranging in length from 8 to 290 microns. We find our measurements have a natural explanation in terms of a spatially varying order parameter that is enhanced in proximity to the higher transition temperature superconducting leads (the longitudinal proximity effect) and suppressed in proximity to the added normal metal structures (the lateral inverse proximity effect). These in-plane proximity effects and scaling relations are observed over unprecedentedly long lengths (in excess of 1000 times the mean free path) and explained in terms of a Ginzburg-Landau model. Our low temperature Ic(B) measurements are found to agree with a general derivation of a superconducting strip with an edge or geometric barrier to vortex entry and we also derive two conditions that lead to Ic rectification. At high temperatures the Ic(B) exhibits distinct Josephson effect behavior over long length scales and following functional dependences not previously reported. We also investigate how film stress changes the transition, explain some transition features in terms of a nonequilibrium superconductivity effect, and show that our measurements of the resistive transition are not consistent with a percolating resistor network model.
Issue Date: 2011-01-21
Rights Information: Copyright 2010 John E. Sadleir
Date Available in IDEALS: 2011-01-21
Date Deposited: 2010-12

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