Files in this item



application/pdf9215829.pdf (3MB)
(no description provided)PDF


Title:Scanning tunneling microscopy of silicon(100) 2 x 1
Author(s):Hubacek, Jerome S.
Doctoral Committee Chair(s):Lyding, Joseph W.
Department / Program:Electrical and Computer Engineering
Discipline:Electrical and Computer Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):Engineering, Electronics and Electrical
Physics, Condensed Matter
Engineering, Materials Science
Abstract:The Si(100) 2 x 1 surface, a technologically important surface in microelectronics and silicon molecular beam epitaxy (MBE), has been studied with the scanning tunneling microscope (STM) to attempt to clear up the controversy that surrounds previous studies of this surface. To this end, an ultra-high vacuum (UHV) STM/surface science system has been designed and constructed to study semiconductor surfaces. Clean Si(100) 2 x 1 surfaces have been prepared and imaged with the STM. Atomic resolution images probing both the filled states and empty states indicate that the surface consists of statically buckled dimer rows.
With electronic device dimensions shrinking to smaller and smaller sizes, the Si-SiO$\sb2$ interface is becoming increasingly important and, although it is the most popular interface used in the microelectronics industry, little is known about the initial stages of oxidation of the Si(100) surface. Scanning tunneling microscopy has been employed to examine Si(100) 2 x 1 surfaces exposed to molecular oxygen in UHV. Ordered rows of bright and dark spots, rotated 45$\sp\circ$ from the silicon dimer rows, appear in the STM images, suggesting that the Si(100)-SiO$\sb2$ interface may be explained with a $\beta$-cristobalite(100) structure rotated by 45$\sp\circ$ on the Si(100) surface.
Issue Date:1992
Rights Information:Copyright 1992 Hubacek, Jerome S.
Date Available in IDEALS:2011-05-07
Identifier in Online Catalog:AAI9215829
OCLC Identifier:(UMI)AAI9215829

This item appears in the following Collection(s)

Item Statistics