Files in this item



application/pdf9416395.pdf (7MB)Restricted to U of Illinois
(no description provided)PDF


Title:Buckling and postbuckling analysis of delaminated beams under compressive loads
Author(s):Lim, Yeow Beng
Doctoral Committee Chair(s):Parsons, I. Dennis
Department / Program:Civil and Environmental Engineering
Discipline:Civil and Environmental Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):Engineering, Civil
Abstract:Two different studies are carried out to understand the influence of geometric parameters on the buckling behavior of a delaminated beam. In the first part, a simple model for predicting the linearized buckling of a composite beam with multiple delaminations is described. The study employs an energy method and arbitrary assumed displacements. Lagrange multipliers are used to enforce the kinematic constraints and boundary conditions, enabling a variety of support conditions to be studied.
In the second part of the study, a finite element approach is used to study the postbuckling behavior of a beam with a single delamination. In this study, we assembled a beam element and computational techniques developed by other researchers into a computer code. A two node finite deformation beam element is used, and the equilibrium path is traced by an arc-length method. Constraints in the form of nonlinear springs are enforced to prevent the beam surfaces from overlapping. The postbuckling characteristics of a perfect structure are followed by a branch switching procedure. Initial imperfections in the form of a small percentage of the first mode and/or the second mode are added to the original perfect structure. The imperfection sensitivity of the structure and possible mode interactions are studied by performing non-linear analysis.
Issue Date:1994
Rights Information:Copyright 1994 Lim, Yeow Beng
Date Available in IDEALS:2011-05-07
Identifier in Online Catalog:AAI9416395
OCLC Identifier:(UMI)AAI9416395

This item appears in the following Collection(s)

Item Statistics