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Title:Knowledge-based testing of VLSI circuits
Author(s):Brahme, Dhananjay S.
Doctoral Committee Chair(s):Abraham, Jacob A.
Department / Program:Electrical and Computer Engineering
Discipline:Electrical and Computer Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Electronics and Electrical
Artificial Intelligence
Computer Science
Abstract:This thesis addresses the problem of testing complex VLSI circuits. Traditional test generation used either low level gate descriptions or low level heuristics such as controllability and observability. In this thesis we have introduced a knowledge based approach to testing, which is based on (i) a hierarchical structural description of the circuit, (ii) a high level behavioral description, and (iii) high-level reasoning. The high-level behavior is specified by a (a) forward function, (b) reverse mfunction, (c) propapage-error functions and (d) the test mfunction for the device. It is shown that this additional knowledge results in significant speedup of the test generation process. We have also developed a new procedure for testing VLSI circuits which have both data and control components. We use the knowledge of data and control paths to propagate and backtrace differently for data and control paths. This results in a substantial speedup of the test generation process for complex VLSI circuits. Finally we have introduced a concept of Class B sequential circuits and developed a technique for testing these circuits, which during the propagate phase of testing a fault marks other tests which are covered by the current test. This drastically reduces the number of tests generated and the time taken for testing Class B sequential circuits.
Issue Date:1990
Type:Text
Language:English
URI:http://hdl.handle.net/2142/22927
Rights Information:Copyright 1990 Brahme, Dhananjay S.
Date Available in IDEALS:2011-05-07
Identifier in Online Catalog:AAI9021656
OCLC Identifier:(UMI)AAI9021656


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