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Title:Efficient direct-method parallel circuit simulation using multilevel node tearing
Author(s):Chang, Mi-Chang
Department / Program:Electrical and Computer Engineering
Discipline:Electrical and Computer Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Electronics and Electrical
Computer Science
Abstract:The direct-method circuit simulation technique solves the entire system at every iteration and thus avoids the problem of slow convergence or even nonconvergence, which could occur when relaxation-based techniques are applied. However, the parallelism of the direct method is not as obvious as that of the relaxation technique. The parallelism in the LU factorization without tearing has been found to be small and one level node tearing could have a large border size if it is forced to partition the circuit into a fixed number of subcircuits. In this thesis we increase the parallelism by using a multilevel node tearing method which maintains a minimum border size while trying to balance the subcircuit sizes. The problems of how to maximize the speedup by scheduling the subcircuits correctly and by choosing the optimal number of levels of partitioning are also studied. A parallel circuit simulator, iPRIDE, is implemented on an ALLIANT FX/8 computer using these techniques. A speedup of 7.3 using 8 processors has been achieved.
Issue Date:1989
Type:Text
Language:English
URI:http://hdl.handle.net/2142/23126
Rights Information:Copyright 1989 Chang, Mi-Chang
Date Available in IDEALS:2011-05-07
Identifier in Online Catalog:AAI8916223
OCLC Identifier:(UMI)AAI8916223


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