Browse College of Engineering by Author "Lai, Liyang"

  • Lai, Liyang (2005)
    The dissertation investigates new techniques for logic built-in self-test (BIST) in VLSI chip testing. The main purpose of these techniques is to improve fault coverage for logic BIST with minimal performance penalty and ...

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  • Lai, Liyang (Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 2005-12)

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