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Title:Soft x-ray near edge spectroscopy of cuprous oxide and silicon-germanium alloys
Author(s):Hulbert, Steven Lloyd
Doctoral Committee Chair(s):Brown, Frederick C.
Department / Program:Physics
Subject(s):high resolution soft x-ray absroption near edge structure (XANES)
silicon-germanium semiconductor alloys
cuprous oxide
crystal structure
Abstract:High resolution soft x-ray absorption near edge structure (XANES) spectra have been obtained for CU20 and for SiGe1-x semiconductor alloys, xas a function of composition x, using the methods of partial electron yield and thin film absorption. The shapes of the near edge features provide a unique fingerprint of the local crystal structure (symmetries, coordinations, bond lengths, etc.) in the bulk. A strong asymmetric peak at threshold in Cu20 is probably best described as a Frenkel core exciton corresponding to an allowed Cu 2p + alg molecular orbital transition of the rare linear (0-Cu-0)3-molecular unit characteristic of Cu20. A dramatic change in the observed soft x-ray absorption near edge structure (XANES) for x = 0.15 in SixGe1-x is consistent with the x-dependence predicted for this alloy system by Newman and Dow. The design, operating characteristics, and advantages of the University of Illinois beam line at the 1 GeV electron storage ring Aladdin, including the new extended range grasshopper (ERG) grazing incidence grating monochromator for use in the VUV and soft x-ray spectral ranges, are presented.
Issue Date:1984
Genre:Dissertation / Thesis
Rights Information:1984 Steven Lloyd Hulbert
Date Available in IDEALS:2011-06-07
Identifier in Online Catalog:824806

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