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Title:X-ray generation by MeV electrons in silicon: Temperature, tilt and thickness dependence
Author(s):Kozlowski, Robert Edward
Doctoral Committee Chair(s):Koehler, James S.
Department / Program:Physics
Discipline:Physics
Degree:Ph.D.
Genre:Dissertation
Subject(s):x-ray generation
silicon
channeling radiation
Bremsstrahlung
Issue Date:1982
Genre:Dissertation / Thesis
Type:Text
Language:English
URI:http://hdl.handle.net/2142/25416
Rights Information:1982 Robert Edward Kozlowski
Date Available in IDEALS:2011-06-16
Identifier in Online Catalog:88456


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