Files in this item



application/pdfKripanidhi_Arjun.pdf (988kB)
(no description provided)PDF


Title:Investigation of the hazards of substrate current injection: transient external latchup and substrate noise coupling
Author(s):Kripanidhi, Arjun
Advisor(s):Rosenbaum, Elyse
Department / Program:Electrical & Computer Eng
Discipline:Electrical & Computer Engr
Degree Granting Institution:University of Illinois at Urbana-Champaign
Complementary metal–oxide–semiconductor (CMOS)
Positive-Negative-Positive-Negative (PNPN)
transient external latchup
substrate noise coupling
Abstract:Substrate current injection is the origin of external latchup and substrate noise coupling. The trigger current for external latchup depends on the duration of the trigger event. A physics-based model is provided to model the effects of aggressor to victim spacing and orientation on transient triggering of external latchup. The latchup susceptibility of standard cell based designs is also investigated. Guard rings are used to reduce latchup susceptibility and to reduce the substrate noise coupled to sensitive analog circuits. In this work, the effectiveness of different guard ring topologies for the reduction of substrate noise coupling is also investigated.
Issue Date:2011-08-25
Rights Information:Copyright 2011 Arjun Kripanidhi
Date Available in IDEALS:2011-08-25
Date Deposited:2011-08

This item appears in the following Collection(s)

Item Statistics