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Title:A Microarchitectural Model of Process Variation for Near-threshold Computing
Author(s):Karpuzcu, Ulya R; Kolluru, Krishna; Kim, Nam Sung; Torrellas, Josep
Subject(s):Near-threshold computing, process variation
Abstract:Near-Threshold Voltage Computing (NTC), where the supply voltage is only slightly higher than the transistors’ threshold voltage, is a promising approach to push back the many-core power wall. A key NTC shortcoming is the higher sensitivity to parameter (process, supply voltage, temperature) variation. This report introduces a microarchitectural model to characterize increased sensitivity to process variation at near-thresold voltages.
Issue Date:2011-11-29
Genre:Technical Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/28573
Publication Status:published or submitted for publication
Peer Reviewed:is peer reviewed
Date Available in IDEALS:2012-05-30


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