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Title:Degradation Studies of Ultrathin Silicon Oxide Under Electrical Stress Using a Scanning Tunneling Microscope
Author(s):Hetrick, James Michael
Doctoral Committee Chair(s):Nayfeh, Munir H.
Department / Program:Physics
Discipline:Physics
Degree:Ph.D.
Genre:Dissertation
Subject(s):silicon oxide
Ultrathin Films
degradation
Scanning Tunneling Microscopy (STM)
Issue Date:1999
Genre:Dissertation / Thesis
Type:Text
Language:English
URI:http://hdl.handle.net/2142/28653
Other Identifier(s):4272869
Rights Information:© 1999 James Michael Hetrick
Date Available in IDEALS:2012-01-17


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