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Title:In situ X-ray diffraction study of electric field induced domain switching and phase transition in PZT-5H
Author(s):Liu, Ming; Hsia, K. Jimmy; Sardela, Mauro, Jr.
Subject(s):experimental solid mechanics
Abstract:In-situ x-ray experiments were conducted to examine the electric-field-induced phase changes in PZT-5H materials. The x-ray diffraction profiles at different electric field levels were analyzed by peak fitting and used to identify the occurrence of non-180° domain switching and phase transition. We found that, in depolarized samples, there exists a threshold electric field for the phase changes; whereas in polarized samples, no such threshold exists. The profound difference in the diffraction profile changes under positive and negative electric fields in polarized samples is responsible for the asymmetry of piezoelectric effects. Peak fitting results show composition and transition of phases as well as domain switching at different electric field levels. These observations further indicate the importance of residual stresses in materials behaviors.
Issue Date:2003-05
Publisher:Department of Theoretical and Applied Mechanics (UIUC)
Citation Info:Published as: Ming Liu, K. Jimmy Hsia, and Mauro Sardela, Jr.. In situ X-ray diffraction study of electric field induced domain switching and phase transition in PZT-5H. Journal of the American Ceramic Society, Vol. 88, No. 1, 2005. pp. 210-215. DOI: 10.1111/j.1551-2916.2004.00048.x. Copyright 2005 Blackwell Publishing.
Series/Report:TAM Reports 1026
Genre:Technical Report
Publication Status:published or submitted for publication
Peer Reviewed:is peer reviewed
Date Available in IDEALS:2007-03-08

This item appears in the following Collection(s)

  • Technical Reports - Theoretical and Applied Mechanics (TAM)
    TAM technical reports include manuscripts intended for publication, theses judged to have general interest, notes prepared for short courses, symposia compiled from outstanding undergraduate projects, and reports prepared for research-sponsoring agencies.

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