Files in this item

FilesDescriptionFormat

application/pdf

application/pdfGoel_Shelley.pdf (593kB)
(no description provided)PDF

Description

Title:Effect of noise on the pull-in dynamics of an electrostatic microswitch
Author(s):Goel, Shelley
Advisor(s):Aluru, Narayana R.
Department / Program:Mechanical Sci & Engineering
Discipline:Mechanical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:M.S.
Genre:Thesis
Subject(s):Thermal Noise
Voltage Noise
Microswitch
Micro-Electro Mechanical System (MEMS)
Abstract:The goal of this research is to investigate the effects of noise on the pull-in dynamics of a micro-electromechanical switch. We take into account thermal noise and noise present in the voltage source. Thermal noise is modeled as white noise. First, we study its effect on the linear response of the system. Then, we study the uncertainty in pull-in time caused by thermal noise. We show that thermal noise does not have a significant effect on the pull-in dynamics. For noise in voltage we study the models of Johnson and flicker noise. We see that, as these noise sources are coupled with non-linear electrostatic force, they enhance the stability of the system and thus delay the occurrence of pull-in. We further see that this noise enhanced stability is aided by the damping forces.
Issue Date:2012-05-22
URI:http://hdl.handle.net/2142/30941
Rights Information:Copyright 2012 Shelley Goel
Date Available in IDEALS:2012-05-22
Date Deposited:2012-05


This item appears in the following Collection(s)

Item Statistics