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Title:Surface stress and reversing size effect in the initial yielding of ultrathin films
Author(s):Gioia, Gustavo; Dai, Xiangyu
Abstract:Very recent experiments indicate that in free-standing metallic films of constant grain size the initial yield stress increases as the film becomes thinner, it peaks for a thickness on the order of 100 nm, and then starts to decrease. This reversing size effect poses two challenges: (1) It cannot be explained using currently available models and (2) it appears to contradict the classical experimental results due to J. W. Beams. Here we show that the reversing size effect can be explained and the contradiction dispelled by taking into account how the initial yielding is affected by the surface stress. We also predict that the mode of failure of a film changes from ductile to brittle for a thickness on the order of 100 nm, in accord with experiments.
Issue Date:2005-08
Publisher:Department of Theoretical and Applied Mechanics (UIUC)
Series/Report:TAM Reports 1069, (2005)
Genre:Technical Report
Publication Status:published or submitted for publication
Peer Reviewed:is peer reviewed
Date Available in IDEALS:2007-03-09
Is Version Of:Published as: Gustavo Gioia and Xiangyu Dai. Surface stress and reversing size effect in the initial yielding of ultrathin films. Journal of Applied Mechanics,Vol.73, No. 2, 2006, pp.254-258. DOI: 10.1115/1.2074767. Copyright 2006 American Society of Mechanical Engineers.

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  • Technical Reports - Theoretical and Applied Mechanics (TAM)
    TAM technical reports include manuscripts intended for publication, theses judged to have general interest, notes prepared for short courses, symposia compiled from outstanding undergraduate projects, and reports prepared for research-sponsoring agencies.

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