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Title:Raman Spectroscopy Of Defective Graphene
Author(s):Neumann, Christopher A.
Contributor(s):Pop, Eric
Raman spectroscopy
Raman scattering
defective graphene
Abstract:Raman spectroscopy has proven to be an invaluable tool for researchers looking to better characterize graphene and related materials, such as carbon nanotubes. Prior work has demonstrated a linear relationship between temperature and position of the G and G’ Raman peaks. However, little work has been done to investigate the D peak, which corresponds to defects in the lattice. In this work we examined defective graphene samples fabricated via chemical vapor deposition (CVD) using a Renishaw inVia Raman microscope and a temperature controlled stage. From this, we find that the peak shift due to temperature of the G’ peak is approximately twice that of the D peak. The temperature dependence of the D peak could be used to measure heat dissipation in the vicinity of defects and edges of graphene devices.
Issue Date:2012-12
Publication Status:unpublished
Peer Reviewed:not peer reviewed
Date Available in IDEALS:2014-01-09

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