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Title:X-ray microscope performance enhancement through control architecture change
Author(s):Mashrafi, Sheikh
Advisor(s):Salapaka, Srinivasa M.; Preissner, Curt
Department / Program:Mechanical Sci & Engineering
Discipline:Mechanical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:M.S.
Genre:Thesis
Subject(s):control
Control Architecture
Advanced Photon Source (APS)
Argonne National Laboratory (ANL)
control algorithms
nanopositioning
nanopositioning devices
Early User Instrument (EUI)
X-ray
optics
robust stability
bandwidth
resolution
disturbance rejection
noise attenuation
scanning probe microscope (SPM)
closed-loop properties
Proportional Integral Derivative (PID)
Glover-McFarlane h-infinity algorithm
1DOF h-infinity controller
h-infinity
Glover-McFarlane controller
Keith Glover
Duncan McFarlane
controller
controller implementation
National Instruments (NI)
CompactRIO
real-time controller
Field-Programmable Gate Array (FPGA)
LabVIEW
biquads structures
closed-loop bandwidth
U.S. Department of Energy (DOE)
Office of Science
DE-AC02-06CH11357
DE-SC0004283
Cross Power Spectral Density (CPSD)
Power Spectral Density (PSD)
Degree Of Freedom (DOF)
Discrete-Time Fourier Transform (DTFT)
Hardware Description language (HDL)
High-Level Synthesis (HLS)
Hard X-ray Nanoprobe (HXN)
In Situ Nanoprobe (ISN)
Laser Doppler Displacement Meter (LDDM)
Physik Instrumente (PI)
Reconfigurable Input/Output (RIO)
Advanced Photon Source (APS) beamline
full-field imaging microscopy
fluorescence mapping
nanodiffraction
transmission imaging
reliability and repeatability of positioning systems
modeling uncertainties
insensitive modeling uncertainties
quantifying trade-offs
trade-offs
design flexibility
design methodology
feedforward
feedback
performance objectives
robustness
Advanced Photon Source (APS) user
beamline scientist
imaging resolution and bandwidth
imaging resolution
nanoprobe
model fitting
curve fitting
model reduction
feedback controllers
X-ray nanoprobe instrument
third-generation synchrotron radiation source
zone plate optics
zone plate
flexure stages
piezoelectric actuators stacks
flexure
Piezoelectric
high-stiffness stages
high-resolution weak-link stages
piezoelectric-transducer
sub-nanometer resolution
subnanometer
optical heterodyning
heterodyning
Optodyne
frequency-shifted laser beam
PID controller
digital to analog converter (DAC)
analog input modules
digital input modules
analog output modules
cRIO-9118
Virtex-5
Virtex-5 LX110 FPGA chassis
NI-9223
NI-9402
NI-9263
System Identification
Identification
black-box identification
parametric model
non-parametric model
welch
pwelch
tfestimate
invfreqs
time domain data
band-limited uniform Gaussian white noise
band-limited
white noise
resonant peak
Balance Realization
minimal realization
controllability
observability
Experimental Frequency response
transfer function
Hankel singular values
Hankel norm
balanced truncation
noise histogram
Open Loop Resolution
closed Loop Resolution
Simulink simulation
LabVIEW simulation
discrete controller
continuous controllers
discrete
Tustin
tustins method
discretization
complementary sensitivity transfer function
sensitivity transfer function
robust stabilization
coprime factorization
Bezout identity
Bezout
stability margin
algebraic Riccati equation
Riccati equation
sub-optimal
suboptimal
sub-optimal controller
optimal controller
mixed-sensitivity optimization
sensitivity optimization
generalized framework
generalized controller framework
stabilizing controller
closed-loop objectives
generalized plant
nominal plant
linear fractional transformation
weighting transfer functions
weighted sensitivity
hinfsyn
bode integral law
waterbed effect
second waterbed formula
Skogestad
Poslethwaite
sensitivity weighting
sensitivity weighting transfer function
nanopositioner
nanopositioning device
nanopositioning system
second order sections
ASPE 28th Annual Meeting
American Society for Precision Engineering (ASPE)
Synchrotron Radiation Instrumentation
Synchrotron
Nanoprobe Instrument
Abstract:The goal of this thesis is to apply control algorithms to improve the performance of nanopositioning devices used on the beamline in Advanced Photon Source (APS) at Argonne National Laboratory (ANL). A prototype device, better known as the Early User Instrument (EUI) was the subject of this work. It consists of X-ray optics stage group that focuses the X-ray beam as a source-size-limited spot onto a sample held on the sample stage group. The controller algorithms that are used should provide the closed-loop with robust stability, large bandwidth, high resolution, disturbance rejection and noise attenuation. Conveniently, the field of scanning probe microscopes (SPMs) have already flourished on this aspect of controller algorithms proven to give desired closed-loop properties. Controller algorithms such as Proportional Integral Derivative (PID), Glover-McFarlane H-infinty algorithm, and 1DOF H-infinty controller were designed and implemented on the EUI system. The controller hardware used for implementation is National Instruments (NI) CompactRIO hardware that consists of a real-time controller, a FPGA built into the hardware chassis, analog I/O modules, and digital I/O modules. NI LabVIEW, the dedicated software to the NI hardware, was used to represent the discrete controllers as biquads structures that ran in the FPGA as a part of the closed-loop . The largest closed-loop bandwidth achieved is of 65 Hz through the 1DOF H-infinty controller and is a 171% improvement over the traditional PID controller. Highest closed- loop resolution achieved by the EUI with a 50 Hz bandwidth 1DOF H-infinty controller is 1.4 nanometers, which is a 180% improvement over the open loop resolution of 7 nanometers.
Issue Date:2014-01-16
URI:http://hdl.handle.net/2142/46671
Rights Information:Copyright 2013 Sheikh Mashrafi
Date Available in IDEALS:2014-01-16
Date Deposited:2013-12


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