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Title:Thermal Radiation Measurements of Graphene for Temperature Extraction
Author(s):Shine, Gautam
Contributor(s):Pop, Eric; Goddard, Lynford
thermal radiation
device modeling
Abstract:Graphene is a two-dimensional carbon crystal arranged in a honeycomb lattice. Its excellent electronic properties and planar geometry make it a viable candidate for nanoelectronic applications. In this study, large-area (0.25 mm2) graphene grown by chemical vapor deposition on a 90 nm SiO2 substrate was put under high bias. The resulting thermal radiation was measured in different infrared wavelength ranges. By comparing the amount of radiation in various bands, an approximate temperature of the emitting source can be determined due to the uniqueness of the blackbody profile at each temperature. Integrated radiation at different biases may also be compared to determine temperature if one temperature is known. These extracted temperatures are compared with the expected temperature calculated using a model based on thermal resistances.
Issue Date:2011-05
Publication Status:unpublished
Peer Reviewed:not peer reviewed
Date Available in IDEALS:2014-01-17

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