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Title:Temperature Noise Reduction Chamber for Laser Diode Testing
Author(s):Cheu, Xin Loong
Contributor(s):Goddard, Lynford
Subject(s):diodes
lasers
laser diodes
semiconductor lasers
device testing
temperature noise reduction
Abstract:Characteristics of semiconductor lasers such as threshold current, quantum efficiency and lasing wavelength are temperature dependent. A typical GaAlAs laser diode shifts 1/4 nm in lasing wavelength with every increase of 1 ºC. Hence, various temperature controllers are built for laser diode testing purposes. This thesis discusses minimizing the temperature noise during testing by reducing the variability of room temperature from ± 1 ºC to 10‐7 ºC in a copper chamber. First, the temperature variability is reduced by 10‐3 using an LDT‐5980 ILX Lightwave temperature controller. The remaining 10‐4 is further achieved by buffering the heat flux of the controller with an insulator. A high sensitivity thermistor, coupled with a wheatstone bridge circuit, is utilized to read the controlled temperature with high precision.
Issue Date:2011-05
Genre:Other
Type:Text
Language:English
URI:http://hdl.handle.net/2142/46971
Publication Status:unpublished
Peer Reviewed:not peer reviewed
Date Available in IDEALS:2014-01-17


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