Browse Report - Coordinated Science Laboratory by Subject "I/O"

  • Koh, Yee Lih (Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 2008-01)
    High-speed serial I/O links are limited in throughput due to intersymbol interference (ISI) and noise. At high data rates, on-board traces are bandlimited due to frequency dependent skin effect and dielectric losses. In ...

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  • Annapareddy, Narasimha Reddy L. (Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1990-08)

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