Files in this item



application/pdfECE499-Sp2013-nookala.pdf (5MB)Restricted to U of Illinois
(no description provided)PDF


Title:Infrared Spectroscopy via Selective Thermal Emission of Two Layer Perfect Absorber
Author(s):Nookala, Nishant
Contributor(s):Wasserman, Daniel
mid-IR sources
thermal emission
Abstract:Strong absorption (and corresponding emission) from a two-layer system consisting of heavily doped silicon and a high-index germanium dielectric layer is studied. Absorption resonances in the mid-infrared via electrical resistive heating have also been demonstrated to be polarization and angle dependent. Such structures have the potential for applications in thermal signature mimicry, thermal cloaking, and frequency selective infrared sources. The simplicity of fabrication (requiring no photolithographic process) allows for inexpensive and rapid deployment of this engineered structure. In this work, a selective electrical pulsing system is presented and tested to resistively heat a group of germanium-on-silicon samples at a determined pulse frequency. Such a system can conceivably be used to create a cheap infrared spectral imaging system when emissions in the time-domain are resolved approximately.
Issue Date:2013-05
Publication Status:unpublished
Peer Reviewed:not peer reviewed
Date Available in IDEALS:2014-03-19

This item appears in the following Collection(s)

Item Statistics