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Title:Implementation of AIMS in Measuring Aggregate Resistance to Polishing, Abrasion, and Breakage
Author(s):Mahmoud, Enad; Ortiz, Eduardo
Abstract:The feasibility of using the Micro-Deval apparatus along with the second-generation Aggregate Imaging System (AIMS) to develop a procedure for measuring aggregate polishing resistance, and to measure aggregate shape properties was investigated. Eleven aggregate sources from the state of Illinois and neighboring states were selected to develop an aggregate polishing experimental procedure using AIMS and Micro-Deval. AIMS was used to measure aggregate shape properties with a special focus on aggregate angularity and surface texture, while Micro-Deval provided the needed polishing/degradation. Mathematical, statistical, and rate of texture loss analysis indicated that all aggregate sources reached terminal texture at 210 minutes or less. Aggregate angularity followed the same trend, and terminal angularity was achieved at 210 minutes or less. As the polishing procedure was finalized, aggregate shape properties were tested for 77 aggregate sources. Shape properties were measured before polishing and after polishing in Micro-Deval at 105 and 210 minutes, and a database was developed using Microsoft Excel. The research team also studied the number of aggregate particles that must be scanned in AIMS. Random sub-sampling and asymptotic analyses were conducted and it was concluded that 120 particles were required. This finding was further evaluated by manual sampling of 120 aggregate particles. The manual sampling proved that 120 particles were enough for AIMS angularity and texture measurements.
Issue Date:2014-05
Publisher:Illinois Center for Transportation/Illinois Department of Transportation
Illinois Center for Transportation Series No. 14-014
Genre:Technical Report
Publication Status:published or submitted for publication
Peer Reviewed:is peer reviewed
Sponsor:Illinois Department of Transportation, R27-129
Rights Information:No restrictions. This document is available to the public through the National Technical Information Service, Springfield, Virginia 22161
Date Available in IDEALS:2014-06-18

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  • Illinois Research and Scholarship
    This is the default collection for all research and scholarship developed by faculty, staff, or students at the University of Illinois at Urbana-Champaign

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