Files in this item

FilesDescriptionFormat

application/pdf

application/pdf6612461.pdf (3MB)Restricted to U of Illinois
(no description provided)PDF

Description

Title:Theoretical and Experimental Studies of Current Saturation Phenomena and Low Frequency Generation-Recombination Noise in Junction-Gate Field-Effect Transistors
Author(s):Wu, Shu-Yau
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Electronics and Electrical
Issue Date:1966
Type:Text
Description:120 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1966.
URI:http://hdl.handle.net/2142/59630
Other Identifier(s):(UMI)AAI6612461
Date Available in IDEALS:2014-12-08
Date Deposited:1966


This item appears in the following Collection(s)

Item Statistics