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Title:Experimental Investigations of the Electronic Properties of the Oxidized Silicon Surface Using Mos Capacitors
Author(s):Collins, Dean Robert
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Electronics and Electrical
Issue Date:1967
Type:Text
Description:94 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1967.
URI:http://hdl.handle.net/2142/59649
Other Identifier(s):(UMI)AAI6711833
Date Available in IDEALS:2014-12-08
Date Deposited:1967


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