Files in this item

FilesDescriptionFormat

application/pdf

application/pdf8127582.pdf (4MB)Restricted to U of Illinois
(no description provided)PDF

Description

Title:Optical Characterization of Thin Metallic and Semiconducting Films in the Far Infrared
Author(s):Durschlag, Mark Stuart
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Physics, Condensed Matter
Abstract:The performance in a cw optically pumped far infrared (fir) laser of a hybrid metal mesh-dielectric mirror consisting of an assembly of thin metallic and semiconducting films is evaluated. Its construction is described and an overview of theoretical approaches predicting its optical properties is outlined. From the general model which best agrees with the experimentally determined transmission a simplified model is derived and shown to maintain sufficient accuracy to warrent its further utilization.
Ultra-thin semiconducting heterostructures are also examined using fir techniques. In particular, it is shown that by fitting a calculated reflectivity based on a simple classical model to the fir reflectivity obtained experimentally, both electrical (free carrier concentration, mobility) and lattice (polar phonon frequencies) parameters can be obtained with reasonable accuracy.
Issue Date:1981
Type:Text
Language:English
Description:119 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1981.
URI:http://hdl.handle.net/2142/66251
Other Identifier(s):(UMI)AAI8127582
Date Available in IDEALS:2014-12-12
Date Deposited:1981


This item appears in the following Collection(s)

Item Statistics