Panat, Rahul P.; Hsia, K. Jimmy; Cahill, David G.(American Institute of Physics, 2005)
Deformation mechanisms involving mass transport by stress driven diffusion influence a large
number of technological problems. We study the formation of undulations on surfaces of stressed
films at high temperature by ...
Liu, Ming; Hsia, K. Jimmy(American Institute of Physics, 2003)
In situ x-ray diffraction measurements are conducted on a polycrystalline ferroelectric material
lead-zironate-titanate-5H at different levels of static electric field. The locking of
electric-field-induced non-180° ...