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|Title:||A Study of Relaxation Techniques for the Transient Analysis of Digital Circuits|
|Department / Program:||Electrical Engineering|
|Degree Granting Institution:||University of Illinois at Urbana-Champaign|
|Subject(s):||Engineering, Electronics and Electrical|
|Abstract:||In the VLSI microelectronics era, the cost of the immense CPU time and memory storage for a "standard" circuit simulator has become prohibitive. In order to achieve dramatic improvement in the performance of the circuit simulator, there are two principal points of departure from the "standard" simulation approach, namely, "tearing" decomposition and "relaxation" decomposition.('1)
This research is to study the numerical convergence and stability properties of several of the relaxation algorithms that have been proposed for the simulation of VLSI circuits. The time-point Gauss-Seidel method with prediction, the exploitation of latency and event scheduling algorithms are implemented into a general purpose circuit simulator SLATE-R (a Simulator with Latency and Tearing--Relaxed
version). The performance of the SLATE-R program in the analysis of various types of integrated circuit technologies is studied.
('1)Compared with the conventional techniques, the tearing decomposition is just some special reordering strategy, therefore, it shares the same numerical properties with the conventional techniques. However, the relaxation decomposition processes one subcircuit at a time and relaxes all other subcircuits, therefore, it is characterized by completely different numerical properties.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1984.
|Date Available in IDEALS:||2014-12-15|
This item appears in the following Collection(s)
Dissertations and Theses - Electrical and Computer Engineering
Dissertations and Theses in Electrical and Computer Engineering
Graduate Dissertations and Theses at Illinois
Graduate Theses and Dissertations at Illinois