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Title:The Use of Hierarchy in Test Generation, Fault Simulation, and Testability Analysis Algorithms
Author(s):Rogers, William Arthur
Doctoral Committee Chair(s):Abraham, Jacob A.
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):Engineering, Electronics and Electrical
Abstract:In the discipline of digital circuit design two activities are extraordinarily compute-intensive: fault simulation and automatic test pattern generation. Historically, since design was done on a single level, simulators and other design tools evolved for single-level circuits. More recent design techniques have incorporated hierarchical methodologies, but the design tools have not followed by exploiting this hierarchy. This thesis extends prior work by incorporating the design hierarchy into a fault simulator and exploiting the hierarchy to achieve improved simulator performance. The hierarchical fault simulator developed in this work is named CHIEFS, which stands for concurrent hierarchical and extensible fault simulator. It is unique in that it stimulates directly from the hierarchical circuit description without flattening the circuit to a single level.
Hierarchy-based fault partitioning techniques are shown to increase simulator performance by substituting high-level functional models for fault-free parts of the circuit, reducing the computation required to perform fault simulation. Examples show that this speedup can range from a factor of 2 for highly sequential circuits to a factor of 180 for large combinational circuits; greater speedup is expected in even larger circuits. A performance model is presented which shows that hierarchical concurrent fault simulation can run in O(n logn) time.
In contrast to CHIEFS, which uses the circuit hierarchy for partitioning, HAT, which stands for heuristic adviser for testability, uses the circuit design hierarchy as contextual information. The hierarchical context is used to refine the testability estimate predicted from a SCOAP-style testability estimator. This approach allows HAT to generate much more accurate testability predictions with little additional computation. HAT shows that the structural information used by many testability analysis tools is too localized and therefore prone to error. HAT also shows that higher-level information can be used to dramatically increase the accuracy of these testability measures.
A hierarchical test generation approach, named SHAMAN, is presented which promises to significantly reduce the computation requirements for test generation with mechanisms similar to those demonstrated for fault simulation in CHIEFS. This approach is based on using functional properties of high-level modules to permit hierarchical circuit reconfiguration and hierarchical test generation.
Issue Date:1988
Description:96 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1988.
Other Identifier(s):(UMI)AAI8815414
Date Available in IDEALS:2014-12-15
Date Deposited:1988

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