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Title:Designing, construction and analysis of line-scanning detection instrument for photonic crystal enhanced fluorescence
Author(s):Zhu, Chenqi
Advisor(s):Cunningham, Brian T.
Department / Program:Electrical & Computer Eng
Discipline:Electrical & Computer Engr
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):fluorescence detection
photonic crystal enhanced fluorescence
detection instrument
Abstract:The work presented in this thesis is the designing, construction, and analysis of a portable line-scanning detection instrument for photonic crystal enhanced fluorescence. In order to increase the fluorescence signal for low-concentration detection, we introduced the photonic crystal enhanced fluorescence detection modality and demonstrated that it is a very effective approach to improve the fluorescence signal and hence the signal-to-noise ratio. Past work on the enhanced fluorescence detection instruments is examined in this thesis. We also proposed and developed a computational model for designing the portable line-scanning detection instrument for photonic crystal enhanced fluorescence (PCEF) based on the bench-top line-scanning detection instrument. From the computational model, we concluded that of the several parameters in the instrument, the quantum efficiency and dark current of the camera are very critical for the detection sensitivity. The numerical aperture of the objective is also important in terms of signal collection efficiency. Based on the computational model, we developed an improved configuration of a portable instrument. The new configuration incorporated changes in components and simplification in design, achieved decrease in cost, and maintained competitive detection sensitivity. Experiments have been run on the new instrument to characterize its performance. The signal-to-noise ratio and detection limit of the portable line-scanning PCEF detection instrument are compared with those of the bench-top line-scanning instrument. Results show that the portable version is able to achieve as low a detection limit as the bench-top line-scanning detection instrument without the electron multiplying effect, while achieved at a decrease in cost and physical size.
Issue Date:2015-01-21
Rights Information:Copyright 2014 Chenqi Zhu
Date Available in IDEALS:2015-01-21
Date Deposited:2014-12

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