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Title:Parallel Testing for Pattern Sensitive Faults in Semiconductor Random Access Memory
Author(s):Mazumder, Pinaki; Patel, Janak H.
Subject(s):RAM
Passive neighborhood pattern sensitive fault
Active neighborhood pattern sensitive fault
Bit lines
Word lines
Sense amplifiers
Issue Date:1986-08
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-86-2232, CSG-56
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/74381
Sponsor:Semiconductor Research Corporation / SRC RSCH 84-06-049-4
Date Available in IDEALS:2015-04-06
2017-07-14


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