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Description
Title: | Parallel Testing for Pattern Sensitive Faults in Semiconductor Random Access Memory |
Author(s): | Mazumder, Pinaki; Patel, Janak H. |
Subject(s): | RAM
Passive neighborhood pattern sensitive fault Active neighborhood pattern sensitive fault Bit lines Word lines Sense amplifiers |
Issue Date: | 1986-08 |
Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-86-2232, CSG-56 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
Description: | Coordinated Science Laboratory was formerly known as Control Systems Laboratory |
URI: | http://hdl.handle.net/2142/74381 |
Sponsor: | Semiconductor Research Corporation / SRC RSCH 84-06-049-4 |
Date Available in IDEALS: | 2015-04-06 2017-07-14 |