Files in this item
| Files | Description | Format |
|---|---|---|
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application/pdf  B43-CSG_56.pdf (12MB) | (no description provided) |
Description
| Title: | Parallel Testing for Pattern Sensitive Faults in Semiconductor Random Access Memory |
| Author(s): | Mazumder, Pinaki; Patel, Janak H. |
| Subject(s): | RAM
Passive neighborhood pattern sensitive fault Active neighborhood pattern sensitive fault Bit lines Word lines Sense amplifiers |
| Issue Date: | 1986-08 |
| Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-86-2232, CSG-56 |
| Genre: | Report |
| Type: | Text |
| Language: | English |
| Description: | Coordinated Science Laboratory was formerly known as Control Systems Laboratory |
| URI: | http://hdl.handle.net/2142/74381 |
| Sponsor: | Semiconductor Research Corporation / SRC RSCH 84-06-049-4 |
| Date Available in IDEALS: | 2015-04-06 2017-07-14 |