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Title:Measurement-Based Analysis of Multiple Errors and Near-Coincident Fault Discovery in a Shared Memory Multiprocessor
Author(s):Mitra, Samir G.; Iyer, Ravishankar K.; Sloan, Mark
Subject(s):Parallel processing
Multiple errors
Simulation probability distributions
Near-coincident faults
Issue Date:1988-07
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-88-2238, CSG-90
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/74392
Sponsor:National Aeronautics and Space Administration / NASA NAG-1-613
Date Available in IDEALS:2015-04-06
2017-07-14


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