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Title:The Complexity of Test Generation at the Transistor Level
Author(s):Najm, Farid; Hajj, Ibrahim
Subject(s):Complexity analysis
MOS circuit testing
Robust test vectors
Sensitization
Switch-level fault models
Transistor-level test generation
Issue Date:1987-12
Publisher:Coordinated Science Laboratory
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-87-2280, DAC-9
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/74486
Sponsor:Semiconductor Research Corporation / SRC RSCH 86-12-109
Date Available in IDEALS:2015-04-06


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