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Title:Fault-Tolerant Computing: An Overview
Author(s):Iyer, R.K.; Patel, J.H.; Fuchs, W.K.; Banerjee, P.; Horst, R.
Subject(s):Fault tolerance
Reliability
Test generation
Simulation
Modeling
Measurement
Commercial designs
Issue Date:1991-06
Publisher:Coordinated Science Laboratory
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-91-2232, CRHC-91-22
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/74516
Sponsor:NASA / NAG-1-613
Semiconductor Research Corporation / 90-DP-109
Joint Services Electronics Program / N00014-90-J-1270
Date Available in IDEALS:2015-04-06


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