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Title:State Justification Using Genetic Algorithms in Sequential Circuit Test Generation
Author(s):Rudnick, Elizabeth M.; Patel, Janak H.
Subject(s):Genetic algorithms
Sequential circuits
State justification
Test generation
VLSI circuit testing
Issue Date:1996-01
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-96-2201, CRHC-96-01
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/74558
Sponsor:ARPA / DABT63-95-C-0069
Semiconductor Research Corporation / SRC 94-DP-109
Hewlett-Packard
Date Available in IDEALS:2015-04-06
2017-07-14


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