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Title:Using Multiple Compacted Responses to Diagnose Scan Response Errors During Testing
Author(s):Lumetta, Steven S.
Subject(s):Scan test
X-tolerance
Test response compaction
Diagnosis
Issue Date:2006-07
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-06-2214, CRHC-06-10
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
Typographical error on cover shows author as Steven S. Lumettaa
URI:http://hdl.handle.net/2142/74592
Sponsor:National Science Foundation / ACI-99-84492 CAREER
Intel Corporation
Date Available in IDEALS:2015-04-06
2017-07-14


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