Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  B59-CRHC_06_10.pdf (6MB) | (no description provided) |
Description
| Title: | Using Multiple Compacted Responses to Diagnose Scan Response Errors During Testing |
| Author(s): | Lumetta, Steven S. |
| Subject(s): | Scan test
X-tolerance Test response compaction Diagnosis |
| Issue Date: | 2006-07 |
| Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-06-2214, CRHC-06-10 |
| Genre: | Report |
| Type: | Text |
| Language: | English |
| Description: | Coordinated Science Laboratory was formerly known as Control Systems Laboratory Typographical error on cover shows author as Steven S. Lumettaa |
| URI: | http://hdl.handle.net/2142/74592 |
| Sponsor: | National Science Foundation / ACI-99-84492 CAREER Intel Corporation |
| Date Available in IDEALS: | 2015-04-06 2017-07-14 |