Files in this item
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application/pdf ![]() | (no description provided) |
Description
Title: | Using Multiple Compacted Responses to Diagnose Scan Response Errors During Testing |
Author(s): | Lumetta, Steven S. |
Subject(s): | Scan test
X-tolerance Test response compaction Diagnosis |
Issue Date: | 2006-07 |
Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-06-2214, CRHC-06-10 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
Description: | Coordinated Science Laboratory was formerly known as Control Systems Laboratory Typographical error on cover shows author as Steven S. Lumettaa |
URI: | http://hdl.handle.net/2142/74592 |
Sponsor: | National Science Foundation / ACI-99-84492 CAREER Intel Corporation |
Date Available in IDEALS: | 2015-04-06 2017-07-14 |