Files in this item
| Files | Description | Format |
|---|---|---|
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application/pdf  B16-316.pdf (21MB) | (no description provided) |
Description
| Title: | The Selection of Failure Location Tests by Path Sensitizing Techniques |
| Author(s): | Howarter, David R. |
| Issue Date: | 1966-08 |
| Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. R-316 |
| Genre: | Report (Grant or Annual) |
| Type: | Text |
| Language: | English |
| Description: | Coordinated Science Laboratory was formerly known as Control Systems Laboratory |
| URI: | http://hdl.handle.net/2142/74975 |
| Sponsor: | Joint Services Electronics Program / DA 28 043 AMC 00073(E) National Science Foundation / NSF GK-36 |
| Date Available in IDEALS: | 2015-04-22 2017-07-14 |