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Description
Title: | The Selection of Failure Location Tests by Path Sensitizing Techniques |
Author(s): | Howarter, David R. |
Issue Date: | 1966-08 |
Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. R-316 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
Description: | Coordinated Science Laboratory was formerly known as Control Systems Laboratory |
URI: | http://hdl.handle.net/2142/74975 |
Sponsor: | Joint Services Electronics Program / DA 28 043 AMC 00073(E) National Science Foundation / NSF GK-36 |
Date Available in IDEALS: | 2015-04-22 2017-07-14 |